Find the coordinates of the vertices of each figure after a dilation with the given scale factor k. Then
graph the original image and the dilation.
R(-2, 1), A(1, 1), 7(0, -1), M(-1,-1); k=2
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de mes here
R
IA
X
Vol
NO

The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to